I'm trying to report battery information for a battery-powered HID device (USB when plugged, BLE otherwise). Reading through the report descriptor from the example in Appendix A of Usage Tables for HID Power Devices (v1.1) I see two collections for reporting data about the battery to the host:
UsagePage(Power Device), Unit(none),
Usage(PresentStatus), Collection(Logical), ; Present status collection
Usage(Good),
UsagePage(Battery System), Usage(BelowRemainingCapacityLimit),
Usage(Charging), Usage(Discharging),
ReportSize(1), ReportCount(4), Logical Minimum (0), Logical Maximum (1), Unit(0),
Feature(Constant, Variable, Absolute, Volatile),
End Collection(), ; End of Present Status collection
UsagePage(Power Device),
Usage(ChangedStatus), Collection(Logical), ; Changed Status collection
Usage(Good),
UsagePage(Battery System), Usage(BelowRemainingCapacityLimit),
Usage(Charging), Usage(Discharging),
ReportSize(2), ReportCount(4), Logical Minimum (0), Logical Maximum (1),
Input(Data, Variable, Absolute, Volatile),
End Collection(), ; End of Changed Status collection
I only have a LiPo battery and a diode to charge it, so I am planning on taking out much of the rest of the power device stuff since I think I can get everything I want from the Battery System usage page. As a result I am looking at something more like (feel free to tell me if this is doomed form the start):
UsagePage(Battery System), Usage(BelowRemainingCapacityLimit),
Usage(Charging), Usage(Discharging),
ReportSize(1), ReportCount(3), Logical Minimum (0), Logical Maximum (1), Unit(0),
Feature(Constant, Variable, Absolute, Volatile),
Looking at the report from the spec, I have two questions:
Why is CapacityMode only size 1? The values are 0 - 3, isn't that a size 2?
What actually goes into the ChangedStatus collection? I see that the report sizes are 2 instead of 1 - are the reporting the old status on there as well? I'm not seeing anything elsewhere in the spec that gives an indication. In fact, the spec says that ChangedStatus elements should be boolean, which should be size 1, no?
CapacityMode can have values 0 to 3, but if your device only supports mode 0 (capacity measured in milliamp-hours) or mode 1 (capacity measured in milliwatt-hours) then I think it is ok to have a 1-bit wide field to record this. You could even define an 8-bit field that only stores the values 0 or 1 even though it could hold values up to 255.
I think the authors of the examples may have been trying to align the fields into 8 bits by making each of the 4 status bits 2-bits wide - so 0, would be stored as 00 and 1 would be stored as 01 in the report. Or it could have been a typo - I have seen many other examples in the USB specifications that have errors in them.
Related
I'm trying to parse gps nmea output from a modem connected to serial port of a cubietruck board (ARM® Cortex™-A7 Dual-Core). The configuration is done succesfully I get 4g network form modem but when I try to see nmea outout of the gps module, I get the following :
$GPRMC,,V,,,,,,,,,,N*53
$GPGSV,2,1,08,07,49.9,43.6,28.2,28,49.9,158.9,29.2,02,3.5,239.1,,05,49.9,286.9,E
$GPGSV,2,2,08,06,,,,08,9.8,68.9,,09,31.6,104.1,,13,20.4,299.5,,1*5E
$GNGNS,112218.9,,,,,NNN,,,,,,*03
$GPVTG,,T,,M,,N,,K,N*2C
$GPGSA,A,1,,,,,,,,,,,,,,,*1E
$GNGSA,A,1,,,,,,,,,,,,,,,*00
$GPGGA,,,,,,0,,,,,,,,*66
$GPRMC,,V,,,,,,,,,,N*53
$GPGSV,2,1,08,07,49.9,43.6,27.9,28,49.9,158.9,29.7,02,3.5,239.1,,05,49.9,286.9,F
$GPGSV,2,2,08,06,,,,08,9.8,68.9,,09,31.6,104.1,,13,20.4,299.5,,1*5E
$GNGNS,112219.9,,,,,NNN,,,,,,*02
Looking in http://aprs.gids.nl/nmea/ I found that $GPGSV is GPS Satellites in view. So what I understand is that I get 2 satellites. Is this perhaps the case that I don't get valid $GPGGA $GPRMC or should I check something else?
You don't have a positional "fix" and therefore get empty values in some of the telegrams. As you probably know, there should be latitude, longitude and other data instead of empty values between the commas. Two satellites are not enough to get a fix, you need at least 3 or 4 to get the position.
The NMEA 0183 standard is weakly defined and doesn't mention what GPS units should do when they don't have a positional fix. Sending empty values is pretty common, but some units might act differently. You can easily tell whether the data is valid or not from the A and V letters. V means void and A means active. In the RMC telegram, you can see a V, meaning the entire thing is void.
The reason you get values in the GSV telegrams is because the GPS is able to see two satellites and therefore calculate the values needed in the telegram.
The third field, 08, is the theoretical number of satellites you would be able to see in good conditions.
So what you have to do is to take the GPS outdoors or connect it to a proper antenna. It will start sending proper values when it's able to see the satellites.
Actually by your two GPGSV sentences you can see 08 satellites - eight of them. You have 2 'sentences' of GSV 2,1,08 means 1 of 2 sentences describing 08 satellites, and 2,2,08 means 2 of 2 sentences describing 08 satellites
I am reading sensor output as square wave(0-5 volt) via oscilloscope. Now I want to measure frequency of one period with Beaglebone. So I should measure the time between two rising edges. However, I don't have any experience with working Beaglebone. Can you give some advices or sample codes about measuring time between rising edges?
How deterministic do you need this to be? If you can tolerate some inaccuracy, you can probably do it on the main Linux OS; if you want to be fancy pants, this seems like a potential use case for the BBB's PRU's (which I unfortunately haven't used so take this with substantial amounts of salt). I would expect you'd be able to write PRU code that just sits with an infinite outerloop and then inside that loop, start looping until it sees the pin shows 0, then starts looping until the pin shows 1 (this is the first rising edge), then starts counting until either the pin shows 0 again (this would then be the falling edge) or another loop to the next rising edge... either way, you could take the counter value and you should be able to directly convert that into time (the PRU is states as having fixed frequency for each instruction, and is a 200Mhz (50ns/instruction). Assuming your loop is something like
#starting with pin low
inner loop 1:
registerX = loadPin
increment counter
jump if zero registerX to inner loop 1
# pin is now high
inner loop 2:
registerX = loadPin
increment counter
jump if one registerX to inner loop 2
# pin is now low again
That should take 3 instructions per counter increment, so you can get the time as 3 * counter * 50 ns.
As suggested by Foon in his answer, the PRUs are a good fit for this task (although depending on your requirements it may be fine to use the ARM processor and standard GPIO). Please note that (as far as I know) both the regular GPIOs and the PRU inputs are based on 3.3V logic, and connecting a 5V signal might fry your board! You will need an additional component or circuit to convert from 5V to 3.3V.
I've written a basic example that measures timing between rising edges on the header pin P8.15 for my own purpose of measuring an engine's rpm. If you decide to use it, you should check the timing results against a known reference. It's about right but I haven't checked it carefully at all. It is implemented using PRU assembly and uses the pypruss python module to simplify interfacing.
I have a board with quite a few flash chips, some of them are showing intermittent failures. Standard memory tests are not showing any specific problem addresses, other than certain chips are failing intermittently under mechanical and thermal stress.
Suspecting the actual connections and not the flash cells themselves, I'm looking for a way to test the parallel bus for address or data pin errors.
There are some memory tests but they apply better to RAM rather than flash memory (http://www.ganssle.com/testingram.htm). Specifically, the parallel flash has a sequence of bus writes to write to each value; a write/verify failure could easily be the write operation which could be any pin on the bus.
Ideas welcome...
The typical memory tests are there to do that. I prefer a pseudo randomizer (deterministic using an lfsr) to the 0xAA, 0x55, 0xFF, 0x00 tests. This allows for an address bus test as well as data bus test in two passes (repeat inverted). I say typical in the sense of wiggle the data bits and address bits both states each and vary the states of signals and their neighbors. The pounding on a ram to create thermal or other stresses, well you cant write very fast to a flash so you cant really do fast write/read cycles.
Flash creates another problem and that is writing then reading back isnt that interesting, you want to write the read back later, hours, days, weeks to determine if the part is actually holding data.
When you say thermal or stress do you mean only during the time it is above X degrees it fails, or do you mean that due to thermal stress it is broken all the time after the event. Likewise with mechanical, while vibrating or under mechanical stress the part fails, but when relieved of that stress it is okay, or the mechanical stress has done permanent damage that can be detected under stress or not.
Now although you cant do fast write/read cycles, you can punish a flash by reading heavily. I have seen read-disturb problems by constant reading of one block or location. Not necessarily something you have time to do for every location, but you might fill the ram with a pseudo random pattern and concentrate on one location for a while, (minutes, tens of minutes), if you have a part that you know is bad see if this accelerates the detection of the problem and if any location will work or only certain ones. then another thing is to read all the locations repetitively for hours/days or leave it sit for hours/days/weeks and then do a read pass without an erase or write and see if it has lost anything.
unfortunately as you probably know each new failure case takes its own research project and development of a new test.
First step to test a memory is data bus test0 0 0 0 0 0 0 • In this test, data bus wiring is properly tested to0 0 0 0 0 0 0 confirm that the value placed on data bus by processor0 0 0 0 0 0 0 is correctly received by memory device at the other end0 0 0 0 0 0 00 0 0 0 0 0 0 • An obvious way to test is to write all possible0 0 0 0 0 0 0 data values and verify 0 0 0 0 0 0 0 • Each bit can be tested independently• To perform walking 1s test, write the first data value given in the table, verify by reading it back, write the second value, verify and so on. • When you reach the end of the table, the test is complete
In the linked article Jack Ganssle says: "Critical to this [test], and every other RAM test algorithm, is that you write the pattern to all of RAM before doing the read test."
Since reading should be isolated from writing, testing the flash is easier. Perform the writing portion of the tests while the system is not under stress. Then perform the reading portion with the system under stress. By recording the address, expected value, and actual value in enough error cases, you should be able to determine the source of the errors.
If the system never fails when doing the above, you can then perform the whole tests while under stress. Any errors that appear are most likely write errors.
I've decided to design a memory pattern that I think I can deduce both data and address errors from. The concept is to use values significantly different as key indicators of possible read errors. The concept is also to detect a failure on one pin at a time.
The test will read alternately from only bottom and top addresses (0x000000 and 0x3FFFFF - my chip has 22 address lines). In those locations I will put 0xFF and 0x00 respectively (byte wide). The idea is to flip all address and data lines and see what happens. (All other values in the flash have at least 3 bits different from 0x00 and 0xFF)
There are 44 addresses that a single pin failure could send me to in error. In each address put one of 22 values to represent which of the 22 address pin was flipped. Each are 2 bits different from each other, and 3 bits different from 00 and FF. (I tried for 3 bits different from each other but 8 bits could only get 14 values)
07,0B,0D,0E,16,1A,1C,1F,25,29,2C,
2F,34,38,3D,3E,43,49,4A,4F,52,58
The remaining addresses I put a nice pattern of six values 33,55,66,99,AA,CC. (3 bits different from all other values) value(address) = nicePattern[ sum of bits set in address % 6];
I tested this and have statistically collected 100s of intermittent failure incidents synchronized to the mechanical stress.
single bit errors detectable
double bit errors deducible (Explainable by a combination of frequent single bit errors)
3 or more bit errors (generally inconclusive)
Even though some of the chips had 3 failing pins, 70% of the incidents were single bit (they usually didn't fail at the same time)
The testing group is now using this to identify which specific connections are failing.
I'm currently working on a project that involves a lot of bit level manipulation of data such as comparison, masking and shifting. Essentially I need to search through chunks of bitstreams between 8kbytes - 32kbytes long for bit patterns between 20 - 40bytes long.
Does anyone know of general resources for optimizing for such operations in CUDA?
There has been a least a couple of questions on SO on how to do text searches with CUDA. That is, finding instances of short byte-strings in long byte-strings. That is similar to what you want to do. That is, a byte-string search is much like a bit-string search where the number of bits in the byte-string can only be a multiple of 8, and the algorithm only checks for matches every 8 bits. Search on SO for CUDA string searching or matching, and see if you can find them.
I don't know of any general resources for this, but I would try something like this:
Start by preparing 8 versions of each of the search bit-strings. Each bit-string shifted a different number of bits. Also prepare start and end masks:
start
01111111
00111111
...
00000001
end
10000000
11000000
...
11111110
Then, essentially, perform byte-string searches with the different bit-strings and masks.
If you're using a device with compute capability >= 2.0, store the shifted bit-strings in global memory. The start and end masks can probably just be constants in your program.
Then, for each byte position, launch 8 threads that each checks a different version of the 8 shifted bit-strings against the long bit-string (which you now treat like a byte-string). In each block, launch enough threads to check, for instance, 32 bytes, so that the total number of threads per block becomes 32 * 8 = 256. The L1 cache should be able to hold the shifted bit-strings for each block, so that you get good performance.
I'm not talking about algorithmic stuff (eg use quicksort instead of bubblesort), and I'm not talking about simple things like loop unrolling.
I'm talking about the hardcore stuff. Like Tiny Teensy ELF, The Story of Mel; practically everything in the demoscene, and so on.
I once wrote a brute force RC5 key search that processed two keys at a time, the first key used the integer pipeline, the second key used the SSE pipelines and the two were interleaved at the instruction level. This was then coupled with a supervisor program that ran an instance of the code on each core in the system. In total, the code ran about 25 times faster than a naive C version.
In one (here unnamed) video game engine I worked with, they had rewritten the model-export tool (the thing that turns a Maya mesh into something the game loads) so that instead of just emitting data, it would actually emit the exact stream of microinstructions that would be necessary to render that particular model. It used a genetic algorithm to find the one that would run in the minimum number of cycles. That is to say, the data format for a given model was actually a perfectly-optimized subroutine for rendering just that model. So, drawing a mesh to the screen meant loading it into memory and branching into it.
(This wasn't for a PC, but for a console that had a vector unit separate and parallel to the CPU.)
In the early days of DOS when we used floppy discs for all data transport there were viruses as well. One common way for viruses to infect different computers was to copy a virus bootloader into the bootsector of an inserted floppydisc. When the user inserted the floppydisc into another computer and rebooted without remembering to remove the floppy, the virus was run and infected the harddrive bootsector, thus permanently infecting the host PC. A particulary annoying virus I was infected by was called "Form", to battle this I wrote a custom floppy bootsector that had the following features:
Validate the bootsector of the host harddrive and make sure it was not infected.
Validate the floppy bootsector and
make sure that it was not infected.
Code to remove the virus from the
harddrive if it was infected.
Code to duplicate the antivirus
bootsector to another floppy if a
special key was pressed.
Code to boot the harddrive if all was
well, and no infections was found.
This was done in the program space of a bootsector, about 440 bytes :)
The biggest problem for my mates was the very cryptic messages displayed because I needed all the space for code. It was like "FFVD RM?", which meant "FindForm Virus Detected, Remove?"
I was quite happy with that piece of code. The optimization was program size, not speed. Two quite different optimizations in assembly.
My favorite is the floating point inverse square root via integer operations. This is a cool little hack on how floating point values are stored and can execute faster (even doing a 1/result is faster than the stock-standard square root function) or produce more accurate results than the standard methods.
In c/c++ the code is: (sourced from Wikipedia)
float InvSqrt (float x)
{
float xhalf = 0.5f*x;
int i = *(int*)&x;
i = 0x5f3759df - (i>>1); // Now this is what you call a real magic number
x = *(float*)&i;
x = x*(1.5f - xhalf*x*x);
return x;
}
A Very Biological Optimisation
Quick background: Triplets of DNA nucleotides (A, C, G and T) encode amino acids, which are joined into proteins, which are what make up most of most living things.
Ordinarily, each different protein requires a separate sequence of DNA triplets (its "gene") to encode its amino acids -- so e.g. 3 proteins of lengths 30, 40, and 50 would require 90 + 120 + 150 = 360 nucleotides in total. However, in viruses, space is at a premium -- so some viruses overlap the DNA sequences for different genes, using the fact that there are 6 possible "reading frames" to use for DNA-to-protein translation (namely starting from a position that is divisible by 3; from a position that divides 3 with remainder 1; or from a position that divides 3 with remainder 2; and the same again, but reading the sequence in reverse.)
For comparison: Try writing an x86 assembly language program where the 300-byte function doFoo() begins at offset 0x1000... and another 200-byte function doBar() starts at offset 0x1001! (I propose a name for this competition: Are you smarter than Hepatitis B?)
That's hardcore space optimisation!
UPDATE: Links to further info:
Reading Frames on Wikipedia suggests Hepatitis B and "Barley Yellow Dwarf" virus (a plant virus) both overlap reading frames.
Hepatitis B genome info on Wikipedia. Seems that different reading-frame subunits produce different variations of a surface protein.
Or you could google for "overlapping reading frames"
Seems this can even happen in mammals! Extensively overlapping reading frames in a second mammalian gene is a 2001 scientific paper by Marilyn Kozak that talks about a "second" gene in rat with "extensive overlapping reading frames". (This is quite surprising as mammals have a genome structure that provides ample room for separate genes for separate proteins.) Haven't read beyond the abstract myself.
I wrote a tile-based game engine for the Apple IIgs in 65816 assembly language a few years ago. This was a fairly slow machine and programming "on the metal" is a virtual requirement for coaxing out acceptable performance.
In order to quickly update the graphics screen one has to map the stack to the screen in order to use some special instructions that allow one to update 4 screen pixels in only 5 machine cycles. This is nothing particularly fantastic and is described in detail in IIgs Tech Note #70. The hard-core bit was how I had to organize the code to make it flexible enough to be a general-purpose library while still maintaining maximum speed.
I decomposed the graphics screen into scan lines and created a 246 byte code buffer to insert the specialized 65816 opcodes. The 246 bytes are needed because each scan line of the graphics screen is 80 words wide and 1 additional word is required on each end for smooth scrolling. The Push Effective Address (PEA) instruction takes up 3 bytes, so 3 * (80 + 1 + 1) = 246 bytes.
The graphics screen is rendered by jumping to an address within the 246 byte code buffer that corresponds to the right edge of the screen and patching in a BRanch Always (BRA) instruction into the code at the word immediately following the left-most word. The BRA instruction takes a signed 8-bit offset as its argument, so it just barely has the range to jump out of the code buffer.
Even this isn't too terribly difficult, but the real hard-core optimization comes in here. My graphics engine actually supported two independent background layers and animated tiles by using different 3-byte code sequences depending on the mode:
Background 1 uses a Push Effective Address (PEA) instruction
Background 2 uses a Load Indirect Indexed (LDA ($00),y) instruction followed by a push (PHA)
Animated tiles use a Load Direct Page Indexed (LDA $00,x) instruction followed by a push (PHA)
The critical restriction is that both of the 65816 registers (X and Y) are used to reference data and cannot be modified. Further the direct page register (D) is set based on the origin of the second background and cannot be changed; the data bank register is set to the data bank that holds pixel data for the second background and cannot be changed; the stack pointer (S) is mapped to graphics screen, so there is no possibility of jumping to a subroutine and returning.
Given these restrictions, I had the need to quickly handle cases where a word that is about to be pushed onto the stack is mixed, i.e. half comes from Background 1 and half from Background 2. My solution was to trade memory for speed. Because all of the normal registers were in use, I only had the Program Counter (PC) register to work with. My solution was the following:
Define a code fragment to do the blend in the same 64K program bank as the code buffer
Create a copy of this code for each of the 82 words
There is a 1-1 correspondence, so the return from the code fragment can be a hard-coded address
Done! We have a hard-coded subroutine that does not affect the CPU registers.
Here is the actual code fragments
code_buff: PEA $0000 ; rightmost word (16-bits = 4 pixels)
PEA $0000 ; background 1
PEA $0000 ; background 1
PEA $0000 ; background 1
LDA (72),y ; background 2
PHA
LDA (70),y ; background 2
PHA
JMP word_68 ; mix the data
word_68_rtn: PEA $0000 ; more background 1
...
PEA $0000
BRA *+40 ; patched exit code
...
word_68: LDA (68),y ; load data for background 2
AND #$00FF ; mask
ORA #$AB00 ; blend with data from background 1
PHA
JMP word_68_rtn ; jump back
word_66: LDA (66),y
...
The end result was a near-optimal blitter that has minimal overhead and cranks out more than 15 frames per second at 320x200 on a 2.5 MHz CPU with a 1 MB/s memory bus.
Michael Abrash's "Zen of Assembly Language" had some nifty stuff, though I admit I don't recall specifics off the top of my head.
Actually it seems like everything Abrash wrote had some nifty optimization stuff in it.
The Stalin Scheme compiler is pretty crazy in that aspect.
I once saw a switch statement with a lot of empty cases, a comment at the head of the switch said something along the lines of:
Added case statements that are never hit because the compiler only turns the switch into a jump-table if there are more than N cases
I forget what N was. This was in the source code for Windows that was leaked in 2004.
I've gone to the Intel (or AMD) architecture references to see what instructions there are. movsx - move with sign extension is awesome for moving little signed values into big spaces, for example, in one instruction.
Likewise, if you know you only use 16-bit values, but you can access all of EAX, EBX, ECX, EDX , etc- then you have 8 very fast locations for values - just rotate the registers by 16 bits to access the other values.
The EFF DES cracker, which used custom-built hardware to generate candidate keys (the hardware they made could prove a key isn't the solution, but could not prove a key was the solution) which were then tested with a more conventional code.
The FSG 2.0 packer made by a Polish team, specifically made for packing executables made with assembly. If packing assembly isn't impressive enough (what's supposed to be almost as low as possible) the loader it comes with is 158 bytes and fully functional. If you try packing any assembly made .exe with something like UPX, it will throw a NotCompressableException at you ;)