I am reading sensor output as square wave(0-5 volt) via oscilloscope. Now I want to measure frequency of one period with Beaglebone. So I should measure the time between two rising edges. However, I don't have any experience with working Beaglebone. Can you give some advices or sample codes about measuring time between rising edges?
How deterministic do you need this to be? If you can tolerate some inaccuracy, you can probably do it on the main Linux OS; if you want to be fancy pants, this seems like a potential use case for the BBB's PRU's (which I unfortunately haven't used so take this with substantial amounts of salt). I would expect you'd be able to write PRU code that just sits with an infinite outerloop and then inside that loop, start looping until it sees the pin shows 0, then starts looping until the pin shows 1 (this is the first rising edge), then starts counting until either the pin shows 0 again (this would then be the falling edge) or another loop to the next rising edge... either way, you could take the counter value and you should be able to directly convert that into time (the PRU is states as having fixed frequency for each instruction, and is a 200Mhz (50ns/instruction). Assuming your loop is something like
#starting with pin low
inner loop 1:
registerX = loadPin
increment counter
jump if zero registerX to inner loop 1
# pin is now high
inner loop 2:
registerX = loadPin
increment counter
jump if one registerX to inner loop 2
# pin is now low again
That should take 3 instructions per counter increment, so you can get the time as 3 * counter * 50 ns.
As suggested by Foon in his answer, the PRUs are a good fit for this task (although depending on your requirements it may be fine to use the ARM processor and standard GPIO). Please note that (as far as I know) both the regular GPIOs and the PRU inputs are based on 3.3V logic, and connecting a 5V signal might fry your board! You will need an additional component or circuit to convert from 5V to 3.3V.
I've written a basic example that measures timing between rising edges on the header pin P8.15 for my own purpose of measuring an engine's rpm. If you decide to use it, you should check the timing results against a known reference. It's about right but I haven't checked it carefully at all. It is implemented using PRU assembly and uses the pypruss python module to simplify interfacing.
Related
I know that you can turn on a vehicle signal (for example, the left indicator) in traci using:
traci.vehicle.setSignals(vehID, int)
where the integer related to the specific signal can be found using the following link (https://sumo.dlr.de/docs/TraCI/Vehicle_Signalling.html#signaling), but is there a way of turning off a specific signal that would be otherwise turned on by the program (i.e., a setSignalOff)?
I think that there is a function in the underlying C++ code (switchOffSignal() in MSVehicle.h) but there doesn't appear to be a traci command that turns off a specific signal.
I appreciate that it is (generally) a pleasant visual aesthetic and has no impact on vehicle behaviour, but it would be very useful for what I am trying to do!
Switching off signals should work from traci. By using sometihng like traci.vehicle.setSignals("ego", 0), I can switch them off. Be aware that this will be reset after the step, so you may have to do that in every timestep.
So, Michael is right in that:
traci.vehicle.setSignals("ego", 0)
should turn off all signals (although the signals still appeared on for me visually, which confused me initially).
To turn off individual signals but keep the others on you need to:
For all the "on" signals find the value of 2^n, where n is the bit integer (which can be found using the following link: https://sumo.dlr.de/docs/TraCI/Vehicle_Signalling.html)
Sum all these 2^n values (let's call this variable x) and use this value in the setSignals function: traci.vehicle.setSignals("ego", x).
So for example, if we want the brake light, the right indicator and the high beam on (but all the other signals off) we would do:
RightIndicatorValue = pow(2,0)
BrakeLightValue = pow(2,3)
HighBeamValue = (2,6)
SignalValue = RightIndicatorValue + BrakeLightValue + HighBeamValue
traci.vehicle.setSignals(("ego", SignalValue)
I am trying to get to get familiar with working with a 74LS148 Priority Encoder IC. I am providing a 5 Volt constant current voltage source to the IC and have a 0 Volt ground Voltage. I tried connecting every input to the 5 Volt source to set it on a HIGH logic state, which should give, according to the truth table, HIGH in the output. Then tried setting some inputs to LOW, but that had no effect in the output which remained in a HIGH state.
I then tried using pull up resistors, the use and circuit configuration of which is not entirely clear to me, which I think is the problem. I connected the resistors as shown in the picture below, which should give a HIGH state in the output. I then tried connecting some inputs, along with their resistors, to the Ground. The output still remained on a HIGH state, around 4.3 Volts.
I repeated the entire process with another 74LS148 IC to make sure the first one was working.
I'd could really use a little help. Thank you all!
74LS148 has the following truth table:
EI (pin-5) must low (connect to ground)
The enable E1 must be ground. you also your diagram indicates inputs 0 through 7 are pulled high. This will always produce your outputs to be HIGH
I think you should include a bleeder resistor at output to draw some constant current. This will help regulator function as desired.
I have a board with quite a few flash chips, some of them are showing intermittent failures. Standard memory tests are not showing any specific problem addresses, other than certain chips are failing intermittently under mechanical and thermal stress.
Suspecting the actual connections and not the flash cells themselves, I'm looking for a way to test the parallel bus for address or data pin errors.
There are some memory tests but they apply better to RAM rather than flash memory (http://www.ganssle.com/testingram.htm). Specifically, the parallel flash has a sequence of bus writes to write to each value; a write/verify failure could easily be the write operation which could be any pin on the bus.
Ideas welcome...
The typical memory tests are there to do that. I prefer a pseudo randomizer (deterministic using an lfsr) to the 0xAA, 0x55, 0xFF, 0x00 tests. This allows for an address bus test as well as data bus test in two passes (repeat inverted). I say typical in the sense of wiggle the data bits and address bits both states each and vary the states of signals and their neighbors. The pounding on a ram to create thermal or other stresses, well you cant write very fast to a flash so you cant really do fast write/read cycles.
Flash creates another problem and that is writing then reading back isnt that interesting, you want to write the read back later, hours, days, weeks to determine if the part is actually holding data.
When you say thermal or stress do you mean only during the time it is above X degrees it fails, or do you mean that due to thermal stress it is broken all the time after the event. Likewise with mechanical, while vibrating or under mechanical stress the part fails, but when relieved of that stress it is okay, or the mechanical stress has done permanent damage that can be detected under stress or not.
Now although you cant do fast write/read cycles, you can punish a flash by reading heavily. I have seen read-disturb problems by constant reading of one block or location. Not necessarily something you have time to do for every location, but you might fill the ram with a pseudo random pattern and concentrate on one location for a while, (minutes, tens of minutes), if you have a part that you know is bad see if this accelerates the detection of the problem and if any location will work or only certain ones. then another thing is to read all the locations repetitively for hours/days or leave it sit for hours/days/weeks and then do a read pass without an erase or write and see if it has lost anything.
unfortunately as you probably know each new failure case takes its own research project and development of a new test.
First step to test a memory is data bus test0 0 0 0 0 0 0 • In this test, data bus wiring is properly tested to0 0 0 0 0 0 0 confirm that the value placed on data bus by processor0 0 0 0 0 0 0 is correctly received by memory device at the other end0 0 0 0 0 0 00 0 0 0 0 0 0 • An obvious way to test is to write all possible0 0 0 0 0 0 0 data values and verify 0 0 0 0 0 0 0 • Each bit can be tested independently• To perform walking 1s test, write the first data value given in the table, verify by reading it back, write the second value, verify and so on. • When you reach the end of the table, the test is complete
In the linked article Jack Ganssle says: "Critical to this [test], and every other RAM test algorithm, is that you write the pattern to all of RAM before doing the read test."
Since reading should be isolated from writing, testing the flash is easier. Perform the writing portion of the tests while the system is not under stress. Then perform the reading portion with the system under stress. By recording the address, expected value, and actual value in enough error cases, you should be able to determine the source of the errors.
If the system never fails when doing the above, you can then perform the whole tests while under stress. Any errors that appear are most likely write errors.
I've decided to design a memory pattern that I think I can deduce both data and address errors from. The concept is to use values significantly different as key indicators of possible read errors. The concept is also to detect a failure on one pin at a time.
The test will read alternately from only bottom and top addresses (0x000000 and 0x3FFFFF - my chip has 22 address lines). In those locations I will put 0xFF and 0x00 respectively (byte wide). The idea is to flip all address and data lines and see what happens. (All other values in the flash have at least 3 bits different from 0x00 and 0xFF)
There are 44 addresses that a single pin failure could send me to in error. In each address put one of 22 values to represent which of the 22 address pin was flipped. Each are 2 bits different from each other, and 3 bits different from 00 and FF. (I tried for 3 bits different from each other but 8 bits could only get 14 values)
07,0B,0D,0E,16,1A,1C,1F,25,29,2C,
2F,34,38,3D,3E,43,49,4A,4F,52,58
The remaining addresses I put a nice pattern of six values 33,55,66,99,AA,CC. (3 bits different from all other values) value(address) = nicePattern[ sum of bits set in address % 6];
I tested this and have statistically collected 100s of intermittent failure incidents synchronized to the mechanical stress.
single bit errors detectable
double bit errors deducible (Explainable by a combination of frequent single bit errors)
3 or more bit errors (generally inconclusive)
Even though some of the chips had 3 failing pins, 70% of the incidents were single bit (they usually didn't fail at the same time)
The testing group is now using this to identify which specific connections are failing.
I would like to know if anyone knows how to perform a cross-correlation between two audio signals on iOS.
I would like to align the FFT windows that I get at the receiver (I am receiving the signal from the mic) with the ones at the transmitter (which is playing the audio track), i.e. make sure that the first sample of each window (besides a "sync" period) at the transmitter will also be the first window at the receiver.
I injected in every chunk of the transmitted audio a known waveform (in the frequency domain). I want estimate the delay through cross-correlation between the known waveform and the received signal (over several consecutive chunks), but I don't know how to do it.
It looks like there is the method vDSP_convD to do it, but I have no idea how to use it and whether I first have to perform the real FFT of the samples (probably yes, because I have to pass double[]).
void vDSP_convD (
const double __vDSP_signal[],
vDSP_Stride __vDSP_signalStride,
const double __vDSP_filter[],
vDSP_Stride __vDSP_strideFilter,
double __vDSP_result[],
vDSP_Stride __vDSP_strideResult,
vDSP_Length __vDSP_lenResult,
vDSP_Length __vDSP_lenFilter
)
The vDSP_convD() function calculates the convolution of the two input vectors to produce a result vector. It’s unlikely that you want to convolve in the frequency domain, since you are looking for a time-domain result — though you might, if you have FFTs already for some other reason, choose to multiply them together rather than convolving the time-domain sequences (but in that case, to get your result, you will need to perform an inverse DFT to get back to the time domain again).
Assuming, of course, I understand you correctly.
Then once you have the result from vDSP_convD(), you would want to look for the highest value, which will tell you where the signals are most strongly correlated. You might also need to cope with the case where the input signal does not contain sufficient of your reference signal, and in that case you may wish to (for example) ignore values in the result vector below a certain level.
Cross-correlation is the solution, yes. But there are many obstacles you need to handle. If you get samples from the audio files, they contain padding which cross-correlation function does not like. It is also very inefficient to perform correlation with all those samples - it takes a huge amount of time. I have made a sample code which demonstrates time shift of two audio files. If you are interested in the sample, look at my Github Project.
I'm not talking about algorithmic stuff (eg use quicksort instead of bubblesort), and I'm not talking about simple things like loop unrolling.
I'm talking about the hardcore stuff. Like Tiny Teensy ELF, The Story of Mel; practically everything in the demoscene, and so on.
I once wrote a brute force RC5 key search that processed two keys at a time, the first key used the integer pipeline, the second key used the SSE pipelines and the two were interleaved at the instruction level. This was then coupled with a supervisor program that ran an instance of the code on each core in the system. In total, the code ran about 25 times faster than a naive C version.
In one (here unnamed) video game engine I worked with, they had rewritten the model-export tool (the thing that turns a Maya mesh into something the game loads) so that instead of just emitting data, it would actually emit the exact stream of microinstructions that would be necessary to render that particular model. It used a genetic algorithm to find the one that would run in the minimum number of cycles. That is to say, the data format for a given model was actually a perfectly-optimized subroutine for rendering just that model. So, drawing a mesh to the screen meant loading it into memory and branching into it.
(This wasn't for a PC, but for a console that had a vector unit separate and parallel to the CPU.)
In the early days of DOS when we used floppy discs for all data transport there were viruses as well. One common way for viruses to infect different computers was to copy a virus bootloader into the bootsector of an inserted floppydisc. When the user inserted the floppydisc into another computer and rebooted without remembering to remove the floppy, the virus was run and infected the harddrive bootsector, thus permanently infecting the host PC. A particulary annoying virus I was infected by was called "Form", to battle this I wrote a custom floppy bootsector that had the following features:
Validate the bootsector of the host harddrive and make sure it was not infected.
Validate the floppy bootsector and
make sure that it was not infected.
Code to remove the virus from the
harddrive if it was infected.
Code to duplicate the antivirus
bootsector to another floppy if a
special key was pressed.
Code to boot the harddrive if all was
well, and no infections was found.
This was done in the program space of a bootsector, about 440 bytes :)
The biggest problem for my mates was the very cryptic messages displayed because I needed all the space for code. It was like "FFVD RM?", which meant "FindForm Virus Detected, Remove?"
I was quite happy with that piece of code. The optimization was program size, not speed. Two quite different optimizations in assembly.
My favorite is the floating point inverse square root via integer operations. This is a cool little hack on how floating point values are stored and can execute faster (even doing a 1/result is faster than the stock-standard square root function) or produce more accurate results than the standard methods.
In c/c++ the code is: (sourced from Wikipedia)
float InvSqrt (float x)
{
float xhalf = 0.5f*x;
int i = *(int*)&x;
i = 0x5f3759df - (i>>1); // Now this is what you call a real magic number
x = *(float*)&i;
x = x*(1.5f - xhalf*x*x);
return x;
}
A Very Biological Optimisation
Quick background: Triplets of DNA nucleotides (A, C, G and T) encode amino acids, which are joined into proteins, which are what make up most of most living things.
Ordinarily, each different protein requires a separate sequence of DNA triplets (its "gene") to encode its amino acids -- so e.g. 3 proteins of lengths 30, 40, and 50 would require 90 + 120 + 150 = 360 nucleotides in total. However, in viruses, space is at a premium -- so some viruses overlap the DNA sequences for different genes, using the fact that there are 6 possible "reading frames" to use for DNA-to-protein translation (namely starting from a position that is divisible by 3; from a position that divides 3 with remainder 1; or from a position that divides 3 with remainder 2; and the same again, but reading the sequence in reverse.)
For comparison: Try writing an x86 assembly language program where the 300-byte function doFoo() begins at offset 0x1000... and another 200-byte function doBar() starts at offset 0x1001! (I propose a name for this competition: Are you smarter than Hepatitis B?)
That's hardcore space optimisation!
UPDATE: Links to further info:
Reading Frames on Wikipedia suggests Hepatitis B and "Barley Yellow Dwarf" virus (a plant virus) both overlap reading frames.
Hepatitis B genome info on Wikipedia. Seems that different reading-frame subunits produce different variations of a surface protein.
Or you could google for "overlapping reading frames"
Seems this can even happen in mammals! Extensively overlapping reading frames in a second mammalian gene is a 2001 scientific paper by Marilyn Kozak that talks about a "second" gene in rat with "extensive overlapping reading frames". (This is quite surprising as mammals have a genome structure that provides ample room for separate genes for separate proteins.) Haven't read beyond the abstract myself.
I wrote a tile-based game engine for the Apple IIgs in 65816 assembly language a few years ago. This was a fairly slow machine and programming "on the metal" is a virtual requirement for coaxing out acceptable performance.
In order to quickly update the graphics screen one has to map the stack to the screen in order to use some special instructions that allow one to update 4 screen pixels in only 5 machine cycles. This is nothing particularly fantastic and is described in detail in IIgs Tech Note #70. The hard-core bit was how I had to organize the code to make it flexible enough to be a general-purpose library while still maintaining maximum speed.
I decomposed the graphics screen into scan lines and created a 246 byte code buffer to insert the specialized 65816 opcodes. The 246 bytes are needed because each scan line of the graphics screen is 80 words wide and 1 additional word is required on each end for smooth scrolling. The Push Effective Address (PEA) instruction takes up 3 bytes, so 3 * (80 + 1 + 1) = 246 bytes.
The graphics screen is rendered by jumping to an address within the 246 byte code buffer that corresponds to the right edge of the screen and patching in a BRanch Always (BRA) instruction into the code at the word immediately following the left-most word. The BRA instruction takes a signed 8-bit offset as its argument, so it just barely has the range to jump out of the code buffer.
Even this isn't too terribly difficult, but the real hard-core optimization comes in here. My graphics engine actually supported two independent background layers and animated tiles by using different 3-byte code sequences depending on the mode:
Background 1 uses a Push Effective Address (PEA) instruction
Background 2 uses a Load Indirect Indexed (LDA ($00),y) instruction followed by a push (PHA)
Animated tiles use a Load Direct Page Indexed (LDA $00,x) instruction followed by a push (PHA)
The critical restriction is that both of the 65816 registers (X and Y) are used to reference data and cannot be modified. Further the direct page register (D) is set based on the origin of the second background and cannot be changed; the data bank register is set to the data bank that holds pixel data for the second background and cannot be changed; the stack pointer (S) is mapped to graphics screen, so there is no possibility of jumping to a subroutine and returning.
Given these restrictions, I had the need to quickly handle cases where a word that is about to be pushed onto the stack is mixed, i.e. half comes from Background 1 and half from Background 2. My solution was to trade memory for speed. Because all of the normal registers were in use, I only had the Program Counter (PC) register to work with. My solution was the following:
Define a code fragment to do the blend in the same 64K program bank as the code buffer
Create a copy of this code for each of the 82 words
There is a 1-1 correspondence, so the return from the code fragment can be a hard-coded address
Done! We have a hard-coded subroutine that does not affect the CPU registers.
Here is the actual code fragments
code_buff: PEA $0000 ; rightmost word (16-bits = 4 pixels)
PEA $0000 ; background 1
PEA $0000 ; background 1
PEA $0000 ; background 1
LDA (72),y ; background 2
PHA
LDA (70),y ; background 2
PHA
JMP word_68 ; mix the data
word_68_rtn: PEA $0000 ; more background 1
...
PEA $0000
BRA *+40 ; patched exit code
...
word_68: LDA (68),y ; load data for background 2
AND #$00FF ; mask
ORA #$AB00 ; blend with data from background 1
PHA
JMP word_68_rtn ; jump back
word_66: LDA (66),y
...
The end result was a near-optimal blitter that has minimal overhead and cranks out more than 15 frames per second at 320x200 on a 2.5 MHz CPU with a 1 MB/s memory bus.
Michael Abrash's "Zen of Assembly Language" had some nifty stuff, though I admit I don't recall specifics off the top of my head.
Actually it seems like everything Abrash wrote had some nifty optimization stuff in it.
The Stalin Scheme compiler is pretty crazy in that aspect.
I once saw a switch statement with a lot of empty cases, a comment at the head of the switch said something along the lines of:
Added case statements that are never hit because the compiler only turns the switch into a jump-table if there are more than N cases
I forget what N was. This was in the source code for Windows that was leaked in 2004.
I've gone to the Intel (or AMD) architecture references to see what instructions there are. movsx - move with sign extension is awesome for moving little signed values into big spaces, for example, in one instruction.
Likewise, if you know you only use 16-bit values, but you can access all of EAX, EBX, ECX, EDX , etc- then you have 8 very fast locations for values - just rotate the registers by 16 bits to access the other values.
The EFF DES cracker, which used custom-built hardware to generate candidate keys (the hardware they made could prove a key isn't the solution, but could not prove a key was the solution) which were then tested with a more conventional code.
The FSG 2.0 packer made by a Polish team, specifically made for packing executables made with assembly. If packing assembly isn't impressive enough (what's supposed to be almost as low as possible) the loader it comes with is 158 bytes and fully functional. If you try packing any assembly made .exe with something like UPX, it will throw a NotCompressableException at you ;)